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Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

213.99 EUR

Erforsche die Geheimnisse atomarer Netzwerke durch Anomalous X‑Ray Scattering: ein tiefgehendes Handbuch, das fortgeschrittene Messmethoden mit präziser Dateninterpretation verbindet und neue Einblicke in Materialstrukturen liefert.

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