Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34) | DealShopping Deutschland
  1. Home
  2. Medien
  3. Bücher
  4. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)
  • #
  • #

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

236.00 EUR 197.54 EUR 16% Off

Teilen:
Gesponsert

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

Medimops DE
197.54 EUR
06-09-2026 23:26:01
Gesponsert

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

SpringerLink DE
236.00 EUR
07-09-2026 11:17:47

Ähnliche Produkte

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

187.98 EUR
Atlas of Two-Dimensional Echocardiography in Congenital Cardiac Defects

Atlas of Two-Dimensional Echocardiography in Congenital Cardiac Defects

59.00 EUR
Lithium Niobate: Defects, Photorefraction and Ferroelectric Switching

Lithium Niobate: Defects, Photorefraction and Ferroelectric Switching

177.00 EUR
Theories of Democracy in Comparison: The Russian Case. Output-oriented Legitimacy, Defect Democracy, Political Culture, Path Dependence and Public Opinion

Theories of Democracy in Comparison: The Russian Case. Output-oriented Legitimacy, Defect Democracy, Political Culture, Path Dependence and Public Opinion

47.95 EUR
Defects and Properties of Semiconductors: Defect Engineering

Defects and Properties of Semiconductors: Defect Engineering

83.00 EUR
Reconstruction of the Head and Neck: A Defect-Oriented Approach

Reconstruction of the Head and Neck: A Defect-Oriented Approach

154.99 EUR