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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

236.00 EUR 207.35 EUR 12% Off

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

Medimops DE
207.35 EUR
23-07-2026 18:34:00
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

SpringerLink DE
236.00 EUR
23-07-2026 13:44:50

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