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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

213.99 EUR 207.35 EUR 3% Off

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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, Band 34)

Medimops DE
207.35 EUR
22-04-2026 05:06:57
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

SpringerLink DE
213.99 EUR
22-04-2026 09:06:50

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