Device characterization of Dy-incorporated HfO2 gate oxide nMOS device: Device characteristics and reliability of DyO/HfO gate dielectrics and the application to NAND Flash memory | DealShopping Deutschland
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Device characterization of Dy-incorporated HfO2 gate oxide nMOS device: Device characteristics and reliability of DyO/HfO gate dielectrics and the application to NAND Flash memory

58.99 EUR

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Device characterization of Dy-incorporated HfO2 gate oxide nMOS device

Hugendubel
58.99 EUR
04-10-2026 11:59:52

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