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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)
106.99 EUR
102.14 EUR
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing) (Frontiers in Electronic Testing, 5, Band 5)
Medimops DE
102.14 EUR
11-05-2026 04:15:09
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From Contamination to Defects, Faults and Yield Loss
SpringerLink DE
106.99 EUR
11-05-2026 09:16:07
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