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Fundamentals Of Atomic Force Microscopy - Part I: Foundations

47.99 EUR 41.58 EUR 13% Off

Ein praxisnaher Leitfaden zur Atomkraftmikroskopie: erklärt die Grundlagen von Messprinzipien, Sensoren und Kalibrierung aus der Sicht eines Technikers und verknüpft sie mit konkreten Anwendungsbeispielen in der Nanoforschung.

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Fundamentals of Atomic Force Microscopy: Part I: Foundations: Part I: Foundation

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Fundamentals Of Atomic Force Microscopy - Part I: Foundations (Lessons from Nanoscience: A Lecture Notes)

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FUNDAM ATOM FORCE MICROSC (P1)

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