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Secondary Ion Mass Spectrometry SIMS IV

109.99 EUR 100.34 EUR 9% Off

Ein Fachband aus Osaka 1983, der die neuesten Erkenntnisse in der Sekundärions-Massenspektrometrie zusammenfasst; enthält Vorträge, experimentelle Daten und theoretische Diskussionen führender Experten.

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