• Brauchen Sie Hilfe?
  • DE
    US CA UK ES FR DE IT
logo
  • Kategorien
    • Baby & Kleinkind
    • Bekleidung & Accessoires
    • Bürobedarf
    • Elektronik
    • Fahrzeuge & Teile
    • Für Erwachsene
    • Gesundheit & Schönheit
    • Heim & Garten
    • Heimwerkerbedarf
    • Kameras & Optik
    • Kunst & Unterhaltung
    • Medien
    • Möbel
    • Nahrungsmittel, Getränke & Tabak
    • Software
    • Spielzeuge & Spiele
    • Sportartikel
    • Taschen & Gepäck
    • Tiere & Tierbedarf
    • Wirtschaft & Industrie
  • Information
    • Über uns
    • Geschäftsbedingungen
    • Datenschutz-Bestimmungen
  • Blog
  • Kontakt
  1. Home
  2. Medien
  3. Bücher
  4. Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
  • #
  • #

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

106.99 EUR 97.84 EUR 9% Off

Teilen:
Gesponsert

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Medimops DE
97.84 EUR
22-04-2026 17:40:48
Gesponsert

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

SpringerLink DE
106.99 EUR
22-04-2026 21:54:53

Ähnliche Produkte

Test Infrastructure Design: for Digital, Mixed-Signal and Hierarchical SOCs

Test Infrastructure Design: for Digital, Mixed-Signal and Hierarchical SOCs

68.00 EUR
Cryogenic Test-bed and Capacitive Sensors for NASA Spacecraft

Cryogenic Test-bed and Capacitive Sensors for NASA Spacecraft

68.00 EUR

MYOELECTRIC UPPER LIMB PROSTHESES FOR HIGH-LEVEL AMPUTATIONS: Design Methodology, Prototype, and Test of an Artificial Arm for Shoulder-Disarticulated Patients

49.00 EUR
Test and Design-for-Testability in Mixed-Signal Integrated Circuits

Test and Design-for-Testability in Mixed-Signal Integrated Circuits

138.98 EUR
Linden, Wim J. van der: Linear Models for Optimal Test Design

Linden, Wim J. van der: Linear Models for Optimal Test Design

149.79 EUR
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

108.94 EUR
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs

85.59 EUR
Design Patterns for High-Quality Automated Tests: High-Quality Test Attributes and Best Practices

Design Patterns for High-Quality Automated Tests: High-Quality Test Attributes and Best Practices

12.49 EUR

Gør dine indkøb enklere med Deal.Shopping. Opdag konkurrencedygtige priser, eksklusive rabatter og de bedste butikker samlet ét sted.

  • 275 New North Road Islington #1689 London, N17AA, UK
  • 1178 Broadway - 3rd Floor, New York, NY 10001, USA

Information

  • Über uns
  • Geschäftsbedingungen
  • Datenschutz-Bestimmungen
  • Kontakt

© Copyright 2026 Deal.Shopping - All Rights Reserved.