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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

SpringerLink DE
94.00 EUR
07-09-2026 11:22:33
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

Hugendubel
96.49 EUR
06-09-2026 12:24:56

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