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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

SpringerLink DE
94.00 EUR
03-08-2026 01:01:56
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

Hugendubel
96.49 EUR
02-08-2026 11:23:52

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