Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces | DealShopping Deutschland
  1. Home
  2. Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
  • #

Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

85.59 EUR

Teilen:
Gesponsert

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

SpringerLink DE
85.59 EUR
08-06-2026 10:57:08

Ähnliche Produkte

Minerals and Reactions at the Atomic Scale

Minerals and Reactions at the Atomic Scale

44.95 EUR
Walkosz, Weronika: Atomic Scale Characterization and First-Principles Studies of Si¿N¿ Interfaces

Walkosz, Weronika: Atomic Scale Characterization and First-Principles Studies of Si¿N¿ Interfaces

106.99 EUR
Walkosz, Weronika: Atomic Scale Characterization and First-Principles Studies of Si¿N¿ Interfaces

Walkosz, Weronika: Atomic Scale Characterization and First-Principles Studies of Si¿N¿ Interfaces

106.99 EUR
Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

Anomalous X-Ray Scattering for Materials Characterization: Atomic-Scale Structure Determination

213.99 EUR
Controllable Synthesis and Atomic Scale Regulation of Noble Metal Catalysts

Controllable Synthesis and Atomic Scale Regulation of Noble Metal Catalysts

181.89 EUR
Transition Metals and Silicon. Magnetic Properties of Thin Films Impurities and Heusler Alloys on the Atomic Scale

Transition Metals and Silicon. Magnetic Properties of Thin Films Impurities and Heusler Alloys on the Atomic Scale

88.00 EUR