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  1. Home
  2. Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces

85.59 EUR

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

SpringerLink DE
85.59 EUR
22-04-2026 09:06:55

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